METHOD OF ASSESSING THE TECHNICAL CONDITION OF SENSOR SYSTEMS BY THEIR ELECTRICAL NOISE CHARACTERISTICS

  • Вадим Сергеевич Александров Kazan National Research Techniсal University named after A.N.Tupolev
Keywords: data processing, correlation analysis, fluctuations, key parameters, fitting function, reference sample

Abstract

This work is devoted to the application of the method of comparative analysis of the technical condition of sensor systems to the processing of model data (a mixture of amplitude-modulated signal and noise) and real data from experimental temperature sensors. It is shown that the processing of model data within the framework of key parameters obeys a well–known law - the Nyquist formula, while the results of processing experimental data within the framework of the distribution of key parameters do not correlate with it. This, in the author's opinion, is due to the high sensitivity of the method to the universal nature of a single measuring device. The error of the fitting function in model and experimental calculations does not exceed 0.8%, which indicates a high accuracy of the results obtained. Thus, data processing does not introduce uncontrolled error into the results obtained, and the proposed approach can be applied to data without a pronounced trend of any nature, both natural and man–made.

Author Biography

Вадим Сергеевич Александров, Kazan National Research Techniсal University named after A.N.Tupolev

Postgraduate student of the Department of Radio Electronics and Information and Measuring Technology of the Institute of Radio Electronics, Photonics and Digital Technologies.

Research interests: noise data processing, correlation analysis, measuring devices.

 SPIN-код: 6295-5177

e-mail:bridgelin2@yandex.ru

Published
2025-07-15
How to Cite
Александров, Вадим. (2025, July 15). METHOD OF ASSESSING THE TECHNICAL CONDITION OF SENSOR SYSTEMS BY THEIR ELECTRICAL NOISE CHARACTERISTICS. Electronics, Photonics and Cyberphysical Systems, 5(2), 8-19. Retrieved from http://elphotkai.ru/article/view/777
Section
Electronics