DEFECTS OF NANOTUBES FOR NANOELECTRONICS: SPLICES
Abstract
The problem of high-frequency oscillations of reflex intensity profiles of microdiffraction patterns of individual nanotubes along layer lines is considered. Possible structures of longitudinal splices of nanotubes with different external and internal radii, the identification of which is necessary when sampling nanotubes for nanoelectronics products, are considered. A comparative mathematical analysis of the oscillations in the cases of ordinary crystals (satellites) and multilayer coaxial nanotubes, as well as two cases of cylindrical accretions was carried out. It is shown that, as in the case of ordinary crystals, the oscillations in the region of the wings of the reflexes are determined by the size of the crystal (the thickness of the tube wall), while the specific oscillations of their main maxima are determined by the inner diameter of the nanotube.
